![goback](data:image/svg+xml;charset=utf-8,<svg xmlns="http://www.w3.org/2000/svg" viewBox="0 0 12 20"><path d="M10,0l2,2l-8,8l8,8l-2,2L0,10L10,0z" fill="%23fff"/></svg>){kind=icon}
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
期刊信息导读
- IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY基本信息
- IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY中科院SCI期刊分区
- 历年IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY影响因子趋势图
- IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY期刊英文简介
- IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY期刊中文简介
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY基本信息
简称：IEEE T DEVICE MAT RE
中文名称：IEEE器件和材料可靠性汇刊
SCI类别：SCIE
是否OA开放访问：No
出版地：UNITED STATES
出版周期：Quarterly
涉及的研究方向：工程技术-工程：电子与电气
通讯方式：IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC, 445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
官方网站：http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7298
投稿网址：http://mc.manuscriptcentral.com/tdmr
审稿速度：较慢,6-12周
平均录用比例:较易
PMC链接：http://www.ncbi.nlm.nih.gov/nlmcatalog?term=1530-4388%5BISSN%5D
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY期刊英文简介
IEEE Transactions on Device and Materials Reliability is published quarterly. It provides leading edge information that is critical to the creation of reliable electronic devices and materials, and a focus for interdisciplinary communication in the state of the art of reliability of electronic devices, and the materials used in their manufacture. It focuses on the reliability of electronic, optical, and magnetic devices, and microsystems; the materials and processes used in the manufacture of these devices; and the interfaces and surfaces of these materials.
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY期刊中文简介
IEEE设备和材料可靠性事务季刊。它提供对可靠电子设备和材料的创造至关重要的前沿信息，并在电子设备及其制造中使用的材料的可靠性方面成为跨学科交流的重点。它侧重于电子、光学、磁器件和微系统的可靠性;用于制造这些装置的材料和工艺;以及这些材料的界面和表面。
中科院SCI期刊分区：
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY影响因子
